2 edition of measurement and modelling of the base spreading resistance of bipola transistors. found in the catalog.
measurement and modelling of the base spreading resistance of bipola transistors.
R. T. Unwin
by Salford University
Written in English
|Contributions||University of Salford.|
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A hybrid dry and wet etch process is used to form a vertical emitter mesa, causing reductions in both the emitter-base gap resistance Rgap and the spreading resistance beneath the. In this talk I describe the design, development and performance of a scanning probe microscopy facility operating at a base temperature of 10 mK in magnetic fields up to 15 T .
Full text of "Distortion Analysis Of Analog Integrated Circuits" See other formats. This banner text can have markup. web; books; video; audio; software; images; Toggle navigation. MATE standardization. NASA Astrophysics Data System (ADS) Farmer, R.
The MATE (Modular Automatic Test Equipment) program was developed to combat the proliferation of unique, expensive ATE within the Air Force. MATE incorporates a standard management approach and a standard architecture designed to implement a cradle-to-grave approach to the acquisition of .